为减少有害微生物对小麦粉的污染，本文研究了电子束辐照对小麦粉的杀菌效果以及对其理化性质、流变学品质的影响。结果表明：电子束辐照处理可显著降低小麦粉中的微生物含量，且随着辐照剂量的增加，杀菌效果越显著；菌落总数、霉菌、酵母、蜡样芽孢杆菌、需氧芽孢菌的辐照杀菌剂量D10值分别为1.94、2.12、2.69、2.51和2.46 kGy；剂量为1~5 kGy时，辐照对小麦粉基本营养成分及氨基酸含量无明显影响；辐照后小麦粉的湿面筋含量、面筋持水率也无明显变化，但面筋指数、降落数值随着剂量增加有所减小；辐照可提高小麦粉面团的吸水率，降低形成时间和稳定时间等；面团的拉伸面积、拉伸阻力和拉伸比例等面团流变学特性参数，均呈现先升高后降低趋势，但变化幅度很小。

To reduce microbial contamination in wheat flour, sterilization of this wheat flour with electron beam irradiation was studied. The effects of irradiation on the physicochemical properties and the rheological quality of wheat flour were investigated. The results showed that electron beam irradiation could significantly reduce the microbial content in a dose-dependent manner. The decimal reduction dose (D10) values of bacterial count, mold, yeast, Bacillus cereus, and aerobic bacillus were 1.94, 2.12, 2.69, 2.51, and 2.46 kGy, respectively. At this range of doses (1~5 kGy), irradiation had no significant effect on the basic nutritional composition and amino acid content of the wheat flour. The wet gluten content and gluten moisture rate of wheat flour did not change significantly, but the gluten index and falling number were decreased with increasing irradiation dose. Irradiation could increase the water absorption rate of wheat flour and reduce the dough development time and stability time. With the increase of irradiation dose, the stretching area, stretching resistance, stretching ratio, and other parameters increased at first, then decreased, but the magnitudes of these changes were not significant.

国家自然科学基金项目（31501579）；公益性行业（农业）科研专项（201303071，201303069）